Preparation for Examinations
In preparing for the examination, the candidate should be aware of the following:
- It is to the candidate’s benefit to become familiar with the types of
questions used, as shown on the ABP Web site.
- Candidates should be familiar with the use of a computer mouse.
- Candidates should not bring any personal items to the exam center. A pencil
and pen are provided at each workstation.
- The most appropriate
preparation for an examination of this kind is a thorough review of the subject,
rather than selective "cramming." The examinations are designed to measure
comprehensive knowledge and the ability to apply that knowledge intelligently.
Anyone suitably prepared in the various subjects should have no undue difficulty
with these examinations.
- In this type of examination, no candidate is expected
to obtain a perfect score. The best procedure is for the candidate to answer all
questions, as a well-considered choice is more often right than wrong.
Candidates must obtain a passing score on both the written and practical
sections of the AP/CP examinations in the same administration. AP/CP candidates
must pass both the AP examination and the CP examination in order to become
certified. Passing one part (AP or CP) of the AP/CP examinations does not
confer certification in that area.
- At the ABP Examination Center, the ABP will provide candidates with Nikon Alphaphot 2 microscopes with 10x wide-field
oculars, 4x, 10x, 40x, and 100x oil immersion objectives, mechanical stages,
abbe condensers, and built-in light sources. Candidates may bring their own
microscopes if they prefer. Ancillary microscope tools (e.g., oil, polarizing lenses,
etc.)
will not be supplied by the ABP. Candidates should bring any
ancillary microscope tools needed, whether or not the candidate brings his/her
own microscope.
- It is very difficult to keep the temperature in the examination room at a level
that is satisfactory to all. It is suggested that those persons sensitive to
lower temperatures bring sweaters or jackets to the examination centers.
This page was last modified on December 5, 2007.